0.3-µm-step mapping of the graphene modes at a 532-nm laser line and comprehensive data analysis
Phase-resolved 3D Raman imaging
Three-dimensional material-sensitive reconstructions with 0.3-µm lateral resolution and sub-diffractive vertical resolution at a 532-nm laser line
Functional Raman analysis
Fractional assessment of the number of the graphene layers based on the shadow that graphene casts on substrate-related Raman-active modes
2D ellipsometric imaging
Mapping of the ellipsometric angles Ψ and Δ at the wavelength of 490 nm
Functional ellipsometric analysis
Fractional assessment of the number of the graphene layers based on the distribution of the ellipsometric angle Ψ at the wavelength of 490 nm
2D Kelvin probe analysis
Assessment of the uniformity of the electrical properties based on the distribution of the surface potential relative to a silicon probe
Transport assessment
Direct-current Hall-effect-derived charge carrier concentration and mobility in static magnetic field of 0.55 T in the temperature range of 300 K to 770 K
In-situ-etched semi-insulating vanadium-compensated on-axis 500-µm-thick 6H-SiC(0001) in two formats: 15 mm × 15 mm and 20 mm × 20 mm
Atomically flat 4H-SiC
In-situ-etched semi-insulating high-purity on-axis 500-µm-thick 4H-SiC(0001) in two formats: 15 mm × 15 mm and 20 mm × 20 mm
Graphene on 6H-SiC
Transfer-free p-type hydrogen-intercalated quasi-free-standing epitaxial Chemical Vapor Deposition graphene on semi-insulating vanadium-compensated nominally on-axis 500-µm-thick 6H-SiC(0001) in two formats: 15 mm × 15 mm and 20 mm × 20 mm
Graphene on 4H-SiC
Transfer-free p-type hydrogen-intercalated quasi-free-standing epitaxial Chemical Vapor Deposition graphene on semi-insulating high-purity nominally on-axis 500-µm-thick 4H-SiC(0001) in two formats: 15 mm × 15 mm and 20 mm × 20 mm
Amorphous Al2O3
Amorphous atomic-layer-deposited aluminum oxide on custom substrate: 10 nm to 100 nm
Four-terminal 1.4-mm × 1.4-mm van der Pauw structure featuring an equal-arm cross-shaped 100-µm × 300-µm active area made of p-type hydrogen-intercalated QFS epitaxial CVD graphene on SI vanadium-compensated on-axis 500-µm-thick 6H-SiC(0001) and passivated with a 100-nm-thick layer of amorphous atomic-layer-deposited Al2O3
Graphene Hall effect sensor on 4H-SiC
Four-terminal 1.4-mm × 1.4-mm van der Pauw structure featuring an equal-arm cross-shaped 100-µm × 300-µm active area made of p-type hydrogen-intercalated QFS epitaxial CVD graphene on SI high-purity on-axis 500-µm-thick 4H-SiC(0001) and passivated with a 100-nm-thick layer of amorphous atomic-layer-deposited Al2O3
Graphene Hall effect sensor on defect-engineered 4H-SiC
Four-terminal 1.4-mm × 1.4-mm van der Pauw structure featuring an equal-arm cross-shaped 100-µm × 300-µm active area made of p-type hydrogen-intercalated QFS epitaxial CVD graphene on pre-epitaxially-modified SI high-purity on-axis 500-µm-thick 4H-SiC(0001) and passivated with a 100-nm-thick layer of amorphous atomic-layer-deposited Al2O3
Dosimetric platform and a genuine Raman protocol for passive estimation of fast-neutron fluence in irradiated SiC and SiC topped with epitaxial graphene
2025
Jagiełło J., Dobrowolski A., Ciuk T., Prokopowicz R., Bieńkowska B., Włodarczyk J., El-Ahmar S., Szary M.J., Szybowicz M. Results in Physics, 75, art. no. 108332.
Sensitivity of Low-Frequency Noise to Thermal Stress in a Graphene-on-SiC Hall Effect Sensor Dedicated to Elevated Temperatures
2025
Sacco L.N., Dobrowolski A., Boshuizen B., Jagiełło J., Pyrzanowska B., Łaszcz A., Ciuk T., Vollebregt S. Diamond and Related Materials, 154, art. no. 112195