0.3-µm-step mapping of the graphene modes at a 532-nm laser line and comprehensive data analysis
Phase-resolved 3D Raman imaging
Three-dimensional material-sensitive reconstructions with 0.3-µm lateral resolution and sub-diffractive vertical resolution at a 532-nm laser line
Functional Raman analysis
Fractional assessment of the number of the graphene layers based on the shadow that graphene casts on substrate-related Raman-active modes
2D ellipsometric imaging
Mapping of the ellipsometric angles Ψ and Δ at the wavelength of 490 nm
Functional ellipsometric analysis
Fractional assessment of the number of the graphene layers based on the distribution of the ellipsometric angle Ψ at the wavelength of 490 nm
2D Kelvin probe analysis
Assessment of the uniformity of the electrical properties based on the distribution of the surface potential relative to a silicon probe
Transport assessment
Direct-current Hall-effect-derived charge carrier concentration and mobility in static magnetic field of 0.55 T in the temperature range of 300 K to 770 K
In-situ-etched semi-insulating vanadium-compensated on-axis 500-µm-thick 6H-SiC(0001) in two formats: 15 mm × 15 mm and 20 mm × 20 mm
Atomically flat 4H-SiC
In-situ-etched semi-insulating high-purity on-axis 500-µm-thick 4H-SiC(0001) in two formats: 15 mm × 15 mm and 20 mm × 20 mm
Graphene on 6H-SiC
Transfer-free p-type hydrogen-intercalated quasi-free-standing epitaxial Chemical Vapor Deposition graphene on semi-insulating vanadium-compensated nominally on-axis 500-µm-thick 6H-SiC(0001) in two formats: 15 mm × 15 mm and 20 mm × 20 mm
Graphene on 4H-SiC
Transfer-free p-type hydrogen-intercalated quasi-free-standing epitaxial Chemical Vapor Deposition graphene on semi-insulating high-purity nominally on-axis 500-µm-thick 4H-SiC(0001) in two formats: 15 mm × 15 mm and 20 mm × 20 mm
Amorphous Al2O3
Amorphous atomic-layer-deposited aluminum oxide on custom substrate: 10 nm to 100 nm
Four-terminal 1.4-mm × 1.4-mm van der Pauw structure featuring an equal-arm cross-shaped 100-µm × 300-µm active area made of p-type hydrogen-intercalated QFS epitaxial CVD graphene on SI vanadium-compensated on-axis 500-µm-thick 6H-SiC(0001) and passivated with a 100-nm-thick layer of amorphous atomic-layer-deposited Al2O3
Graphene Hall effect sensor on 4H-SiC
Four-terminal 1.4-mm × 1.4-mm van der Pauw structure featuring an equal-arm cross-shaped 100-µm × 300-µm active area made of p-type hydrogen-intercalated QFS epitaxial CVD graphene on SI high-purity on-axis 500-µm-thick 4H-SiC(0001) and passivated with a 100-nm-thick layer of amorphous atomic-layer-deposited Al2O3
Graphene Hall effect sensor on defect-engineered 4H-SiC
Four-terminal 1.4-mm × 1.4-mm van der Pauw structure featuring an equal-arm cross-shaped 100-µm × 300-µm active area made of p-type hydrogen-intercalated QFS epitaxial CVD graphene on pre-epitaxially-modified SI high-purity on-axis 500-µm-thick 4H-SiC(0001) and passivated with a 100-nm-thick layer of amorphous atomic-layer-deposited Al2O3
Piętak-Jurczak, K., Gaca, J., Dobrowolski, A., Jagiełło, J., Wzorek, M., Zalewska, A., Ciuk, T. ACS Applied Electronic Materials, 6, art. no. 1729−1739.
Defect-engineered graphene-on-silicon-carbide platform for magnetic field sensing at greatly elevated temperatures
2023
Ciuk, T., Kozłowski, R., Romanowska, A., Zagojski, A., Piętak-Jurczak, K., Stańczyk, B., Przyborowska, K., Czołak, D., Kamiński, P. Carbon Trends, 13, art. no. 100303.
Contamination-induced inhomogeneity of noise sources distribution in Al2O3-passivated quasi-free-standing graphene on 4H-SiC(0001)
2022
Ciuk, T., Ciura, Ł., Michałowski, P.P., Jagiełło, J., Dobrowolski, A., Piętak, K., Kalita, D., Wzorek, M., Budzich, R., Czołak, D., Kolek, A. Physica E: Low-Dimensional Systems and Nanostructures, 142, art. no. 115264.